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Scanning probe microscopy
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371	CALIFORNIA STATE SCIENCE FAIR 2014 PROJECT SUMMARY Name(s) Callie M. McCaffery Add to Reading List Source URL: www.usc.edu Language: English - Date: 2014-04-25 17:09:24 Deflection Architecture Science Construction Scanning probe microscopy Cantilever mechanics Nanotechnology Cantilever Structural system
372	Opening for one postdoctoral position Organic Thin Film Growth by in situ and real-time SPM ISMN – CNR The Nanotechnology of Multifunctional Materials Group (NMM) at the Add to Reading List Source URL: www.one-p.eu Language: English - Date: 2011-08-21 15:11:53 Nanotechnology Ultra-high vacuum Microscopy Microscope Canton of Neuchâtel Chemistry Technology Scanning probe microscopy Science
373	OI Top Strip Corp Colour.tif Add to Reading List Source URL: www.asylumresearch.com Language: English - Date: 2014-11-15 00:24:51 Scientific method Atomic force microscopy Piezoresponse force microscopy Microscopy Kelvin probe force microscope Magnetic force microscope Scanning tunneling microscope Scanning probe microscopy Science Chemistry
374	Flyer NATForceActivScan 10.cdr Add to Reading List Source URL: www.iff.fraunhofer.de Language: English - Date: 2014-12-05 18:26:45 Chemistry Intermolecular forces Atomic force microscopy Near-field scanning optical microscope Microscopy Microscope Canton of Neuchâtel Gwyddion Optical microscope Science Scanning probe microscopy Scientific method
375	Microsoft Word - 3_Lab_Unit_FD.doc Add to Reading List Source URL: depts.washington.edu Language: English - Date: 2009-07-20 14:30:46 Scanning probe microscopy Spectroscopy Force spectroscopy Atomic force microscopy Adhesion Humidity Van der Waals force Microscopy Properties of water Chemistry Intermolecular forces Science
376	Microsoft Word - 4_Lab_UNIT_4_FM_Final_rev07_book.doc Add to Reading List Source URL: depts.washington.edu Language: English - Date: 2008-02-14 15:31:43 Scanning probe microscopy Intermolecular forces Atomic force microscopy Condensed matter physics Microscopy Diode Glass transition Chemistry Science Scientific method
377	Charging of single Si nanocrystals by atomic force microscopy E. A. Boer, L. D. Bell, M. L. Brongersma, H. A. Atwater, M. L. Ostraat et al. Citation: Appl. Phys. Lett. 78, [removed]); doi: [removed] View online: Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2012-11-06 14:32:31 Scientific method Emerging technologies Intermolecular forces Atomic force microscopy Nanowire Microscopy Quantum dot Scanning probe microscopy Nanotechnology Science
378	JOURNAL OF APPLIED PHYSICS VOLUME 90, NUMBER 6 15 SEPTEMBER 2001 Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2007-07-14 19:22:52 Science Atomic force microscopy Resonance Scanning probe microscopy Scientific method Physics
379	Microsoft Word - 4b_Lab_Unit_LFM.doc Add to Reading List Source URL: depts.washington.edu Language: English - Date: 2009-07-20 14:30:47 Chemistry Intermolecular forces Atomic force microscopy Microscopy Scanning probe microscopy Scientific method Science
380 $Scanning probe microscopy / Diffraction / Emerging technologies / Microscopes / Spectroscopy / Scanning tunneling microscope / Quantum dot / Reflection high-energy electron diffraction / Atomic force microscopy / Science / Scientific method / Chemistry$	APPLIED PHYSICS LETTERS 86, 033103 共2005兲 Probing the size and density of silicon nanocrystals in nanocrystal memory device applications Tao Feng,a兲 Hongbin Yu, Matthew Dicken, James R. Heath, and Harry A. Atwater Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2006-10-31 04:02:21 Scanning probe microscopy Diffraction Emerging technologies Microscopes Spectroscopy Scanning tunneling microscope Quantum dot Reflection high-energy electron diffraction Atomic force microscopy Science Scientific method Chemistry

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